IEEE Design & Test

期刊基本信息

期刊名称：IEEE Design & Test

出版国家或地区：UNITED STATES

是否OA：No

期刊ISSN：2168-2356

期刊官方网站：https://www.ieee.org/membership-catalog/productdetail/showProductDetailPage.html?product=PER311-EPC

涉及的研究方向：COMPUTER SCIENCE, HARDWARE & ARCHITECTURE-ENGINEER

期刊数据表：

IEEE Design & Test英文简介：

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

IEEE Design & Test中文简介：

IEEE设计与测试提供了描述用于设计和测试微电子系统的模型、方法和工具的原创作品，从设备和电路到完整的片上系统和嵌入式软件。该杂志专注于当前和近期的实践，包括教程、入门文章和现实案例研究。该杂志力求通过专栏、访谈和圆桌讨论，为读者带来重要的技术进步，同时也为技术领导者及其观点。主题包括半导体集成电路设计、半导体知识产权模块、设计、验证和测试技术、制造和生产设计、嵌入式软件和系统、低功耗和节能设计、电子设计自动化工具、实用技术和标准。

IEEE Design & Test在线问答：